Testing of electronic circuits (Modul D)
Higher education teachers: Žemva Andrej
Credits: 6
Semester: summer
Subject code: 64265S
Subject description
Prerequisits:
Enrolment in the 1st year of 2nd cycle master study programme in Electrical Engineering, basic knowledge of electronic circuits.
Content (Syllabus outline):
INTRODUCTION: Role of testing, digital, analog and mixed signal test, VLSI technology trends affecting testing.
VLSI TESTING PROCESS AND TEST EQUIPMENT: How to test chips? Types of testing, automatic test equipment.
TEST ECONOMICS AND PRODUCT QUALITY: Test economics, costs of testing, yield, defect level, defect level estimation.
FAULT MODELING: Types of defects, faults and errors, functional and structural testing, single stuck-at and multiple faults model, bridging fault model.
LOGIC AND FAULT SIMULATION: Circuit modelling for logic simulation at different levels, algorithms for logic simulation, algorithms for fault simulation.
AUTOMATIC TEST-PATTER GENERATION: Definition of test-pattern generator, redundancy identification, systems for automatic test pattern generation, testing of synchronous and asynchronous sequential circuits.
MEMORY TEST: Failure analysis, test methods of memory devices.
ANALOG AND MIXED-SIGNAL TEST: Functional DSP-based testing, test methods of ADC and DAC devices, model-based testing.
DELAY TEST: Delay test problem, delay test methodologies, practical considerations in delay testing.
TEST IDDQ: IDDQ test principle and survey of IDDQ methods, effectiveness and limitations of IDDQ test.
DESIGN FOR TESTABILITY: DFT methods and DFT rules, scan design rules, scan and partial-scan design, variations of scan designs.
BUILT-IN SELF-TEST (BIST): The economic case of BIST, test-pattern generation for BIST, test points insertion, memory BIST.
BOUNDARY SCAN STANDARD: Purpose of standard, circuit configuration with boundary standard IEEE 1149.1 (JTAG), analog test bus (ATB), targeted analog faults, boundary scan in analog circuits.
SYSTEM TEST: System test and core based design, functional and diagnostic test (fault dictionary, diagnostic tree, a microprocessor system test example), test architecture for system-on-a-chip (SOC).
Objectives and competences:
- to acquire the knowledge of reasons for circuit defects, errors and faults, their detection and diagnosis,
- knowledge on fault modelling for various design errors and circuit implementation defects,
- knowledge of fault simulation and automatic test-pattern generation algorithms,
- knowledge of algorithms and methods for delay testing,
- to master techniques for circuit design for testability,
- practical approaches of design and test of electronic circuits.
Intended learning outcomes:
- fundamental knowledge of circuit testing,
- understanding of testing role in design and implementation of electronic circuits,
- self-dependence by selecting the proper testing method and ability to test and fault diagnosis,
- knowledge of design for testability,
- knowledge of further studies on advanced circuit design and test.
Learning and teaching methods:
- lectures (slides and blackboard)
- laboratory assignments (hands on fault detection and fault diagnosis in digital, analog and mixed-signal integratedcircuits.
Study materials
- GIZOPOULOS, Dimitris (Ed.). Advances in Electronic Testing: Challenges and Methodologies, Springer, 2006.
- WUNDERLICH, Hans-Joachim. Models in Hardware Testing, Springer Verlag, 2010.
- BUSHNELL, Michael, AGRAWAL, Wishwani. Essentials of Electronic Testing for Digital, Memory and Mixed Signal VLSI Circuits, Springer Publishing Company, 2013.
- NAVABI, Zainalabedi. Digital System Test and Testable Design: Using HDL Models and Architectures, Springer, 2011.
Study in which the course is carried out
- 1 year - 2nd cycle - Electrical Engineering - Control Systems and Computer Engineering
- 1 year - 2nd cycle - Electrical Engineering - Biomedical Engineering
- 1 year - 2nd cycle - Electrical Engineering - Electrical Power Engineering
- 1 year - 2nd cycle - Electrical Engineering - Electronics
- 1 year - 2nd cycle - Electrical Engineering - Mechatronics
- 1 year - 2nd cycle - Electrical Engineering - Robotics
- 1 year - 2nd cycle - Electrical Engineering - Information and Communication Technologies